Reliability of Nanoscale Circuits and Systems
Methodologies and Circuit Architectures
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Product description
This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.
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Details
- ISBN13 9781441962171
- Released 2010
- Publisher Springer
- Format Elektronisk medie
- Language English