Fundamentals of Electromigration-Aware Integrated Circuit Design
Please note that the standard 14-day cancellation right terminates upon receiving access to the e-book.
Product description
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.
Accessibility information
Select variation, to see accessibility information
Details
- ISBN13 9783319735580
- Released 2018
- Publisher Springer
- Format Elektronisk medie
- Language English