Random Non-Random Periodic Faulting in Crystals
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Product description
This book provides a comprehensive overview of stacking faults in crystal structures. Subjects covered include: notations used in representations of close-packed structures; types of faults; methods of detection and measurement such as X-ray diffraction, electron diffraction and other techniques; theoretical models of non-random faulting during phase transitions; specific examples of - close packed structures including, zinc sulphide, silicon carbide and silver iodide.
Accessibility information
Details
- ISBN13 9781351552363
- Released 2017
- Publisher Routledge
- Format Elektronisk medie
- Edition 1
- Language English