Reliability of Nanoscale Circuits and Systems

Methodologies and Circuit Architectures
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Produkt beskrivelse

This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.

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Detaljer

  • ISBN13 9781441962171
  • Udgivet 2010
  • Forlag Springer
  • Sprog Engelsk